Cap inspection system

The cap inspection system (CIS) is designed to detect defects in the polymer seal of metal caps. The seal ensures tight closure of metal containers.

Common defects of a polymer seal: foreign particles, tears, jams, etc.).

The detectable defect size is 1.0 mm or more.

Inspection speed is 1 cap per second.

When a defect is detected, the CIS generates a digital signal to reject the cap with a defective seal.

The sensitivity limits of the CIS rejection criteria may be configured and adjusted.

To ensure a contrast and glare-free image, a special dome light was developed and made for CIS to fit the sealed cap size.